Characterization of Ⅲ-nitrides nano-patterns fabricated by atomic force microscopy and by Characterization of semiconductors by scanning probe microscopy
碩士 === 國立臺灣海洋大學 === 光電科學研究所 === 95 === Abstract The thesis describes the characterization of the luminescent property of oxidation-patterned Ⅲ-N light emitting diodes (LEDs) and the characterization of sulfidated Ⅱ-Ⅵ semiconductors by atomic force microscopy (AFM) . First, nano-scale oxidation patte...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/07931983803185696104 |