An Analog/Mixed-Signal Circuits Macromodel Technique for Yield Analysis Applications
碩士 === 國立臺灣大學 === 電子工程學研究所 === 95 === As the IC fabrication technology advances, the transistor feature size keeps shrinking and it is possible now to integrate a complete system on a chip. However, as the device size decreases, the inevitable process variations become an important factor of manufac...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2006
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/72622898939897154053 |