Diagnosis of Multiple Scan Chain Timing Faults

碩士 === 國立臺灣大學 === 電子工程學研究所 === 95 === This thesis presents a diagnosis technique to locate multiple timing faults in scan chains. Jump simulation is a novel parallel simulation technique which quickly searches for the upper and the lower bounds of every individual fault, in spite of the interaction...

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Bibliographic Details
Main Authors: Wei-Shun Chuang, 莊惟舜
Other Authors: Chien-Mo Li
Format: Others
Language:en_US
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/53916743310587044525