Diagnosis of Multiple Scan Chain Timing Faults
碩士 === 國立臺灣大學 === 電子工程學研究所 === 95 === This thesis presents a diagnosis technique to locate multiple timing faults in scan chains. Jump simulation is a novel parallel simulation technique which quickly searches for the upper and the lower bounds of every individual fault, in spite of the interaction...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | en_US |
Published: |
2007
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Online Access: | http://ndltd.ncl.edu.tw/handle/53916743310587044525 |