Dynamical Analysis and Control of a Non-contact Atomic Force Microscopy Probe System
碩士 === 國立臺灣科技大學 === 高分子系 === 95 === The objective of this thesis is to discuss the dynamic analysis and controlling system design for atomic force microscopy, with the aim to enhance the system stability and achieve accuracy and precision in positioning. First, the kinetic and potential energy of sy...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/82w587 |