The Atomic Force Microscope Probe Measurement System based on Self-Tuning Neuro Controller
碩士 === 國立臺灣科技大學 === 高分子系 === 95 === The objective of this thesis is to use neural network for tuning the controller parameters of the atomic force microscopy probe measurement system, with the aim to improve the traditional approach, which replies on experiences and trial-and-error in industrial app...
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| Format: | Others |
| Language: | zh-TW |
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2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/aan47h |