Refractive Index and Thickness Determinations Using a Near-common- and Unequal-path Wavelength Scanning Interferometer
碩士 === 國立臺北科技大學 === 光電工程系研究所 === 95 === A new and simple interferometer based on three designs, near-common-path, unequal optical-path-length, and rotating analyzer, is proposed for refractive index and thickness of a transparent plate determinations. These designs make the interferometer with the c...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/pyb27v |