Refractive Index and Thickness Determinations Using a Near-common- and Unequal-path Wavelength Scanning Interferometer
碩士 === 國立臺北科技大學 === 光電工程系研究所 === 95 === A new and simple interferometer based on three designs, near-common-path, unequal optical-path-length, and rotating analyzer, is proposed for refractive index and thickness of a transparent plate determinations. These designs make the interferometer with the c...
Main Authors: | Tzu-Lung Lin, 林志龍 |
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Other Authors: | Shyh-Tsong Lin |
Format: | Others |
Language: | zh-TW |
Published: |
2007
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Online Access: | http://ndltd.ncl.edu.tw/handle/pyb27v |
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