The Switch of the Worst Case on NBTI and HC Reliability of 0.13 μm MOSFETs
碩士 === 國立臺北科技大學 === 機電整合研究所 === 95 === Hot carrier (HC) effect is a critical reliability problem. Early researches indicated that MOSFETs showed the worst degradation at DAHC mode low temperature. However, a recent study reported that the worst case has switched from DAHC to CHC mode from low to hig...
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| Format: | Others |
| Language: | en_US |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/65kjar |