Learning Vector Quantization Neural Networks for LED Wafer Defect Inspection
碩士 === 國立雲林科技大學 === 資訊工程研究所 === 95 === Automatic visual inspection of defects plays an important role in industrial manufacturing with the benefits of low-cost and high accuracy. In light-emitting diode (LED) manufacturing, each die on the LED wafer must be inspected to determine whether it has defe...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/47582348564411150125 |