Low-contrast surface inspection of mura defects in TFT-LCDsusing Independent Component Analysis and Wavelet Transform
碩士 === 元智大學 === 工業工程與管理學系 === 95 === This research proposes a machine vision method for detecting non-uniform brightness defects, called mura, in TFT-LCD manufacturing. Mura will cause bright or black blocks when LCD panels are switched on. It has low-contrast and uneven brightness properties, and c...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/40189020988807459094 |