Low-contrast surface inspection of mura defects in TFT-LCDs using Empirical Mode Decomposition
碩士 === 元智大學 === 工業工程與管理學系 === 95 === There is a large category of defects, called mura, in TFT-LCD manufacturing. Mura appears as a low-contrast and non-uniform brightness region in the image. The human inspectors are unable to distinguish between the normal regions and mura effectively. A mura defe...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/90684603247493898043 |