Low-contrast surface inspection of mura defects in TFT-LCDs using Empirical Mode Decomposition
碩士 === 元智大學 === 工業工程與管理學系 === 95 === There is a large category of defects, called mura, in TFT-LCD manufacturing. Mura appears as a low-contrast and non-uniform brightness region in the image. The human inspectors are unable to distinguish between the normal regions and mura effectively. A mura defe...
Main Authors: | Chiu-Yen Wu, 吳秋燕 |
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Other Authors: | 蔡篤銘 |
Format: | Others |
Language: | zh-TW |
Published: |
2007
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Online Access: | http://ndltd.ncl.edu.tw/handle/90684603247493898043 |
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