Block-Based Built-In Self-Repair Architectures for Content-Addressable Memories

碩士 === 輔仁大學 === 電子工程學系 === 96 === This paper describes BIST and repair architectures for content-addressable memories. With our proposed architectures, the CAM array is divided into column banks and row banks. If the CAM array contains both column banks and row banks, the overlapped area of a column...

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Bibliographic Details
Main Authors: Kuan-Chen Lin, 林冠全
Other Authors: Shyue-Kung Lu
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/58298523550601736902