Constructing a Issue Equipment Diagnosis AnalysisUsing Data Mining Technology In TFT-LCD Manufacturing Factory
碩士 === 輔仁大學 === 應用統計學研究所 === 96 === Yield improvement is a critical for TFT-LCD manufacturing factory to remain competitive in the market. In order to keep high yield, a quick response diagnostic tool to find root cause about a quality accident is more important in today’s manufacturing fab. The fo...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/10615407416482322165 |