Process Design and Parameter Optimization on Nano Imprint

碩士 === 華梵大學 === 機電工程學系博碩專班 === 96 === Because of the limitation arising from the expensive equipments and installments in the clean room, the reduction in feature size of the semiconductor, and the immense increase in R&D time and budget, the traditional manufacturing of the semiconductor have b...

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Bibliographic Details
Main Authors: Yin-Hao Chang, 鄭尹豪
Other Authors: Jong-Zen Huang
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/22258969760049874938