An Effective Method to Detect Multiple Configuration Upset–caused Routing Errors in SRAM-based FPGAs
碩士 === 國立中興大學 === 資訊科學與工程學系 === 96 === In general, SRAM-based FPGA has the possibility of influencing by radiation particles in our surround environment. SRAM components struck by such particles will cause signal noise and state change in a single memory cell leading to a SEU or “soft error”. This k...
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/76210815409659375360 |