A New Test Approach for NoC Functional Testing

碩士 === 國立中興大學 === 資訊科學與工程學系 === 96 === Network-on-chip (NoC) communication fabrics will be increasingly used in many large multi-core system-on-chip designs in the near future. A relevant challenge that arises from this trend is that the test costs associated with NoC infrastructures may account for...

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Bibliographic Details
Main Authors: Kuang-Wei Lee, 李光偉
Other Authors: 黃德成
Format: Others
Language:en_US
Online Access:http://ndltd.ncl.edu.tw/handle/04567924356362215892