The Study of Ohmic Contact of InN and Surface Treatment
碩士 === 國立成功大學 === 微電子工程研究所碩博士班 === 96 === In this dissertation, we first study the basic electrical and optical properties of InN epilayer by hall measurement, atomic force microscope (AFM), X-ray Diffraction (XRD) and scanning electron microscope (SEM). Electrical properties on InN epilayer are exc...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Online Access: | http://ndltd.ncl.edu.tw/handle/74287822233346245134 |