A Study on Microstructure and Mechanical Properties of Ti-Si-N Thin Flims by Reactive Co-sputtering

碩士 === 國立成功大學 === 機械工程學系碩博士班 === 96 === In this study, the nanocomposites of Ti-Si-N thin flims were prepared by reactive magnetron co-sputtering system and annealed by rapid thermal annealing (RTA) in 500℃. After annealing , the thin films were used to be examined thermal stability. The aim of arti...

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Bibliographic Details
Main Authors: Jhih-Jie Jhu, 朱志傑
Other Authors: Chen-Kuei Chung
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/01839667425997009463