Modulated Signal Analysis of Apertureless Scanning Near-Field Optical Microscopy
博士 === 國立成功大學 === 機械工程學系碩博士班 === 96 === For hundreds of years, the resolution of optical microscopy was limited to the order of approximately as a result of the far-field diffraction effect. Aperture scanning near-field optical microscopes (SNOM) are one of the most commonly-employed instruments f...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/26572504497543812816 |