Measurement of Coplanarity and Warpage of Electronic Components Using Shadow Moire Method

碩士 === 國立成功大學 === 機械工程學系碩博士班 === 96 === In this paper, the major purpose is to develop a method to determine the coplanarity quickly and to measure the coplanarity and warpage of electronic components using shadow moiré method. The time of calculating the coplanarity can be decreased effectively. In...

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Bibliographic Details
Main Authors: Ching-Chao Chen, 陳璟照
Other Authors: Terry Yuan-Fang Chen
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/65515152280977541978