A new method for measuring the axis direction and refraction index of birefringence thin film by SPR combined with Genetic Algorithm
碩士 === 國立成功大學 === 奈米科技暨微系統工程研究所 === 96 === A method for determining the birefringence index,azimuthal angle, and pretilt angle of an anisotropic thin film by measuring the surface plasmon resonance (SPR) device lens/Silver/SiO2 is proposed. In this paper, we use genetic algorithm method combine with...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/99576572516072143099 |