A Data Mining Approach to the Control of Thickness Variation for Polyimide Film Manufacturing
碩士 === 國立交通大學 === 工業工程與管理系所 === 96 === Process yield is a very important performance index for manufacturing. In order to enhance yield, process data will be automatically or semi-automatically recorded for diagnosing faults. Many production processes often involve hundreds of process and quality pa...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/52770366408172516744 |