Advanced Process Control in Deep Trench Poly Hard Mask Open Etch Process

碩士 === 國立交通大學 === 工學院碩士在職專班精密與自動化工程組 === 96 === This study proposes an Advanced Process Control (APC) method to control the critical dimension (CD) of Deep Trench Poly Hard Mask Open (DTPHMO) process. The correlation analysis method and regression analysis method are used to build up the prediction...

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Bibliographic Details
Main Authors: Chi-Yeh Huang, 黃啟業
Other Authors: An-Chen Lee
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/71484617340428689879