A study on Nickel-silicide induced lateral crystallization of amorphous silicon thin film and its microstructural analysis

碩士 === 國立交通大學 === 材料科學與工程系所 === 96 === In this research, crystallization of a-Si films on glass substrate using Nickel disilicide (NiSi2) induced crystallization technique at low temperature and its corresponding lateral crystallization behavior has been studied. Nickel silicide layer was deposited...

Full description

Bibliographic Details
Main Authors: Lin Yu Hsiang, 林郁祥
Other Authors: C.G.Chao
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/43635324216693745644