Investigation of the Mechanism and Reliability in a Two-Bit SONOS Flash Memory
碩士 === 國立交通大學 === 電子工程系所 === 96 === For the design of advanced flash memories with better data retention characteristics, SONOS (Silicon Oxide Nitride Oxide Silicon) will become the main stream of nonvolatile memory products because of its simplicity in structure and scalable by comparing with conve...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/00711881673803377573 |