Matching Properties of Nanoscale MOSFETs
碩士 === 國立交通大學 === 電子工程系所 === 96 === This thesis investigates the current mismatch and derives a physical model. First, we have discussed the back-gate bias control on subthreshold circuit mismatch. We have measured the MOSFETs operated in subthreshold region with different gate widths and lengths. T...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/31045443999825508335 |