Epitaxial Lateral Overgrowth of GaN Thick Films on Porous Mask Fabricated by Ni Film Dewetting Phenomenon

碩士 === 國立交通大學 === 電子物理系所 === 96 === In this work, we propose a new process to fabricate porous SiO2 as epitaxial lateral overgrowth (ELOG) mask. Nanometer or micrometer scale porous Ni film formed by the dewetting of two-dimensional Ni film on SiO2 during rapid thermal annealing was investigated. Th...

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Bibliographic Details
Main Authors: Pei-Lun Wu, 吳佩倫
Other Authors: Wei-I Lee
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/53135620724993465524