Low Threshold Voltage and High Drive Current Poly-Silicon Thin Film Transistors Using Aluminum Metal Gate and HfLaO Dielectric

碩士 === 國立交通大學 === 電機學院微電子奈米科技產業專班 === 96 === We have integrated a Metal gate into Low temperature Poly-Silicon(LTPS) thin-film transistors (TFTs) with high-�n���n gate dielectric. We used Aluminum for metal gate, and we used HfLaO for high-k gate dielectric on LTPS. We got high drive current, low th...

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Main Authors: Chen-Yi Huang, 黃群懿
Other Authors: Albert Chin
Format: Others
Language:en_US
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/543cp7
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spelling ndltd-TW-096NCTU57950072019-05-15T19:48:25Z http://ndltd.ncl.edu.tw/handle/543cp7 Low Threshold Voltage and High Drive Current Poly-Silicon Thin Film Transistors Using Aluminum Metal Gate and HfLaO Dielectric 低臨限電壓與高驅動電流之薄膜電晶體在金屬鋁與介電層氧化鑭鉿上之研究 Chen-Yi Huang 黃群懿 碩士 國立交通大學 電機學院微電子奈米科技產業專班 96 We have integrated a Metal gate into Low temperature Poly-Silicon(LTPS) thin-film transistors (TFTs) with high-�n���n gate dielectric. We used Aluminum for metal gate, and we used HfLaO for high-k gate dielectric on LTPS. We got high drive current, low threshold voltage and low sub-threshold slop to improve the performance of device obviously. It also achieved high on/off ratio and high gate breakdown electric field. The excellent performances mentioned above are related closely to gate dielectric. We used HfLaO for high-k dielectric and it can product high density gate capacitor and less EOT. This kind of device is different from other common devices because it is not necessary to apply passive treatment or specific process of crystallization. We only used furnace to crystallize. Albert Chin 荊鳳德 2007 學位論文 ; thesis 73 en_US
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language en_US
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sources NDLTD
description 碩士 === 國立交通大學 === 電機學院微電子奈米科技產業專班 === 96 === We have integrated a Metal gate into Low temperature Poly-Silicon(LTPS) thin-film transistors (TFTs) with high-�n���n gate dielectric. We used Aluminum for metal gate, and we used HfLaO for high-k gate dielectric on LTPS. We got high drive current, low threshold voltage and low sub-threshold slop to improve the performance of device obviously. It also achieved high on/off ratio and high gate breakdown electric field. The excellent performances mentioned above are related closely to gate dielectric. We used HfLaO for high-k dielectric and it can product high density gate capacitor and less EOT. This kind of device is different from other common devices because it is not necessary to apply passive treatment or specific process of crystallization. We only used furnace to crystallize.
author2 Albert Chin
author_facet Albert Chin
Chen-Yi Huang
黃群懿
author Chen-Yi Huang
黃群懿
spellingShingle Chen-Yi Huang
黃群懿
Low Threshold Voltage and High Drive Current Poly-Silicon Thin Film Transistors Using Aluminum Metal Gate and HfLaO Dielectric
author_sort Chen-Yi Huang
title Low Threshold Voltage and High Drive Current Poly-Silicon Thin Film Transistors Using Aluminum Metal Gate and HfLaO Dielectric
title_short Low Threshold Voltage and High Drive Current Poly-Silicon Thin Film Transistors Using Aluminum Metal Gate and HfLaO Dielectric
title_full Low Threshold Voltage and High Drive Current Poly-Silicon Thin Film Transistors Using Aluminum Metal Gate and HfLaO Dielectric
title_fullStr Low Threshold Voltage and High Drive Current Poly-Silicon Thin Film Transistors Using Aluminum Metal Gate and HfLaO Dielectric
title_full_unstemmed Low Threshold Voltage and High Drive Current Poly-Silicon Thin Film Transistors Using Aluminum Metal Gate and HfLaO Dielectric
title_sort low threshold voltage and high drive current poly-silicon thin film transistors using aluminum metal gate and hflao dielectric
publishDate 2007
url http://ndltd.ncl.edu.tw/handle/543cp7
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