Using Genetic Algorithm to Establish Thresholds of Wafer Retesting When Maximizing Profit
碩士 === 國立中央大學 === 工業管理研究所 === 96 === In order to verify whether wafer can be able to achieve expected specification, generally every die will be probed completely after being fabricated in wafer fab. By such operation, we can use the essential index to improve wafer foundry’s quality and also the yi...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/71722295105799960644 |