LCD Mura Detection using Accumulated Differences and Multisolution Background Subtraction
碩士 === 國立中央大學 === 資訊工程研究所 === 96 === As TFT-LCD (Thin-Film Transistor Liquid-Crystal Display) devices get more and more popular and competitive in display market; the inspection of TFT-LCD quality has received increasing attention and become a more critical issue for manufacturers. TFT-LCD is compos...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Online Access: | http://ndltd.ncl.edu.tw/handle/31895035949762495729 |