A Study on the Critical Success Factors for Defect Management System on the Semiconductor Fabrication Industry

碩士 === 國立彰化師範大學 === 資訊管理學系所 === 96 === Abstract In order to cope with semiconductor process moving on 54 nanometer, the relative technology needed in this industry is more and more progressive. Also, the most concerned issues in the operation of every main semiconductor industry are not beyond the...

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Bibliographic Details
Main Authors: Cheng,Li-Wha, 鄭麗華
Other Authors: Huang, Mu-Jung
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/31397308348572667183