Investigation on Degradation Effect of Low-Temperature Poly-Si TFT under Dynamic Stress
碩士 === 國立中山大學 === 光電工程研究所 === 96 === In this research, the degradation effect of the low temperature polycrystalline silicon TFTs (LTPS TFTs) under dynamic stress was investigated. The experiment results revealed that the degenerate behaviors of n- and p-type poly-Si were different. In p-channel TFT...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/4336gf |