Electroreflectance spectroscopy of InGaAs
碩士 === 國立中山大學 === 物理學系研究所 === 96 === The electroreflectance spectra(ER) have been measured on InxGa1-xAs film under various bias(Vbias), and they have exhibited many Franz-Keldysh Oscillations(FKOs) above band-gap energy. Their strength of field in the film can be obtained by the periods of FKOs. D...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2008
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Online Access: | http://ndltd.ncl.edu.tw/handle/t9mu2f |