M-plane InN Growth and Characterization
碩士 === 國立中山大學 === 物理學系研究所 === 96 === InN thin films were grown on γ-LiAlO2 (100) by plasma-assisted molecular-beam epitaxy (PAMBE). Structural properties were investigated by reflective high-energy electron diffraction (RHEED), x-ray diffraction (XRD), scanning electron microscopy (SEM), atomic forc...
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Others |
Language: | zh-TW |
Online Access: | http://ndltd.ncl.edu.tw/handle/xgt636 |