M-plane InN Growth and Characterization
碩士 === 國立中山大學 === 物理學系研究所 === 96 === InN thin films were grown on γ-LiAlO2 (100) by plasma-assisted molecular-beam epitaxy (PAMBE). Structural properties were investigated by reflective high-energy electron diffraction (RHEED), x-ray diffraction (XRD), scanning electron microscopy (SEM), atomic forc...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/xgt636 |