Fault Detection Analysis of Batch Profile Data
碩士 === 國立清華大學 === 統計學研究所 === 96 === Batch process has been widely applied in the chemicals, pharmaceutical, and semiconductor industries. Based on the limitation of measurement devices, we cannot measure the quality characteristics of products immediately and then have no information to monitor and...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/37372648863693851086 |