High Quality Pattern Generation for Delay Defects with Functional Sensitized Paths
碩士 === 國立清華大學 === 電機工程學系 === 96 === Test patterns of path delay faults (PDFs) are usually generated with static or robust sensitizing criteria for side inputs of gates, because defects affecting the delays of the PDFs will be captured by these patterns unconditionally. However, under functional sens...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/67318565348883872800 |