Silicon wafer through-holes fabricated by photo-assisted electrochemical etching

碩士 === 國立臺灣師範大學 === 機電科技研究所 === 96 === This research developed photo-assisted electrochemical etching (PAECE) system with low-cost light source for fabricating high-density silicon wafer through-holes array. This process is described as followed: high-density through-holes array in silicon is etched...

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Main Authors: Jia-You Lo, 羅嘉佑
Other Authors: Chii-Rong Yang
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/gxf929
id ndltd-TW-096NTNU5657002
record_format oai_dc
spelling ndltd-TW-096NTNU56570022019-05-15T19:38:21Z http://ndltd.ncl.edu.tw/handle/gxf929 Silicon wafer through-holes fabricated by photo-assisted electrochemical etching 晶圓穿孔陣列之光輔助電化學蝕刻特性研究 Jia-You Lo 羅嘉佑 碩士 國立臺灣師範大學 機電科技研究所 96 This research developed photo-assisted electrochemical etching (PAECE) system with low-cost light source for fabricating high-density silicon wafer through-holes array. This process is described as followed: high-density through-holes array in silicon is etched by photo-assisted electrochemical etching under various parameters, such as illumination, surfactants, and concentrations, then to improve the through-hole etching fabrication to obtain through-holes array with high etching rate and smooth etching sidewall. The developed technology will be promising for applications of integrated probe array and wafer-level package in the further. Its advantages are described as followed: low-cost system and fabrication, manufacture, high yield, and suitable for semiconductor process. Using PAECE technology to fabricate wafer through-holes array, we can get the structures with high etching rate and smooth etching sidewall through silicon substrate with thickness of 500 um when the etching time reached 16.7 hours. The smallest width of through-hole by PAECE is 21 um, and the highest aspect ratio is 17.7. The related experimental parameters are described as followed: illumination is 18000-32000 lux, chose surfactants are 1 wt.% DC-1, 1 wt.% MA, 2.5 wt.% H2O2 and 1 wt.% Alcohol. The black micro holes array fabricated by PAECE 2 hr with 1 wt.% MA has ultra-low reflectivity 0.43%, and reflectivity of through-holes array also has equal values about 0.4-05%. Results of this research proved that PAECE technology had been able to partially replace the dry etching technology. It has advantages for applications of integrated probe array and interconnection of wafer-level package. After PAECE fabrication, the black micro holes array will be applied to antireflective structure of solar cell to improve the efficiency obviously. Chii-Rong Yang 楊啟榮 2008 學位論文 ; thesis 174 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立臺灣師範大學 === 機電科技研究所 === 96 === This research developed photo-assisted electrochemical etching (PAECE) system with low-cost light source for fabricating high-density silicon wafer through-holes array. This process is described as followed: high-density through-holes array in silicon is etched by photo-assisted electrochemical etching under various parameters, such as illumination, surfactants, and concentrations, then to improve the through-hole etching fabrication to obtain through-holes array with high etching rate and smooth etching sidewall. The developed technology will be promising for applications of integrated probe array and wafer-level package in the further. Its advantages are described as followed: low-cost system and fabrication, manufacture, high yield, and suitable for semiconductor process. Using PAECE technology to fabricate wafer through-holes array, we can get the structures with high etching rate and smooth etching sidewall through silicon substrate with thickness of 500 um when the etching time reached 16.7 hours. The smallest width of through-hole by PAECE is 21 um, and the highest aspect ratio is 17.7. The related experimental parameters are described as followed: illumination is 18000-32000 lux, chose surfactants are 1 wt.% DC-1, 1 wt.% MA, 2.5 wt.% H2O2 and 1 wt.% Alcohol. The black micro holes array fabricated by PAECE 2 hr with 1 wt.% MA has ultra-low reflectivity 0.43%, and reflectivity of through-holes array also has equal values about 0.4-05%. Results of this research proved that PAECE technology had been able to partially replace the dry etching technology. It has advantages for applications of integrated probe array and interconnection of wafer-level package. After PAECE fabrication, the black micro holes array will be applied to antireflective structure of solar cell to improve the efficiency obviously.
author2 Chii-Rong Yang
author_facet Chii-Rong Yang
Jia-You Lo
羅嘉佑
author Jia-You Lo
羅嘉佑
spellingShingle Jia-You Lo
羅嘉佑
Silicon wafer through-holes fabricated by photo-assisted electrochemical etching
author_sort Jia-You Lo
title Silicon wafer through-holes fabricated by photo-assisted electrochemical etching
title_short Silicon wafer through-holes fabricated by photo-assisted electrochemical etching
title_full Silicon wafer through-holes fabricated by photo-assisted electrochemical etching
title_fullStr Silicon wafer through-holes fabricated by photo-assisted electrochemical etching
title_full_unstemmed Silicon wafer through-holes fabricated by photo-assisted electrochemical etching
title_sort silicon wafer through-holes fabricated by photo-assisted electrochemical etching
publishDate 2008
url http://ndltd.ncl.edu.tw/handle/gxf929
work_keys_str_mv AT jiayoulo siliconwaferthroughholesfabricatedbyphotoassistedelectrochemicaletching
AT luójiāyòu siliconwaferthroughholesfabricatedbyphotoassistedelectrochemicaletching
AT jiayoulo jīngyuánchuānkǒngzhènlièzhīguāngfǔzhùdiànhuàxuéshíkètèxìngyánjiū
AT luójiāyòu jīngyuánchuānkǒngzhènlièzhīguāngfǔzhùdiànhuàxuéshíkètèxìngyánjiū
_version_ 1719093068214304768