Optical Studies of AlInGaP, InGaN and SiCSemiconductors and Heterostrcutures
碩士 === 國立臺灣大學 === 光電工程學研究所 === 96 === A series of optical characterization techniques, including Raman scattering, Fourier transform infrared spectroscopy (FTIR), photoluminescence (PL), Photoreflectance (PR) and X-ray diffraction (XRD), were employed to assess wide band gap semiconductors which are...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/24419963211175753687 |