Structures and electrical properties of bismuth thin films grown at low temperature
博士 === 臺灣大學 === 物理研究所 === 96 === Bismuth thin films were grown by pulsed laser deposition on glass substrates with the substrate temperature from 110 K to 473 K. The structure of the films was characterized by X-ray diffraction. The surface morphology was studied by atomic force microscopy and X-¬ra...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/28704948028661397860 |