Diagnosis of Logic-chain Bridging Faults
碩士 === 國立臺灣大學 === 電子工程學研究所 === 96 === This thesis proposes five logic-chain bridging fault models, which involve one net in the combinational logic and the other net in the scan chain. Test results of logic-chain bridging faults, unlike any existing fault, depend on the previous scan inputs as well...
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| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/07000879798726412013 |