An Effective Power Management Flow inMTCMOS Design
碩士 === 國立臺灣大學 === 電機工程學研究所 === 96 === In the deep sub-micron CMOS technology, leakage current increases so exponentially that it becomes a significant drain on the total power consumption. In the 65 nanometer process, leakage current is expected to reach 50% of total power consumption. Due to the fa...
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/14648895935991846283 |