Study the Properties of Materials and Devices by X-ray Photoelectron Spectroscopy

碩士 === 國立臺灣科技大學 === 化學工程系 === 96 === In this thesis, we use X-ray Photoelectron Spectroscopy (XPS) to study the chemical structures of thin film materials and devices, which are described below. The study of oxygen plasma treatment on ZnPc thin film solar cell, XPS data show that gold oxide forme...

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Bibliographic Details
Main Authors: Yung-yu Hsu, 許永鈺
Other Authors: Yian Tai
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/06902722685218903298