The properties of copper using electroplating for blind filling in advanced electronic package

碩士 === 國立聯合大學 === 化學工程學系碩士班 === 96 === With the miniaturization of electronic devices,the connection reliability between integrated circuits(IC)and the external circuits has become important. A shorter connection between the IC chip and the substrate is demanded with the downsizing of circuit packag...

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Bibliographic Details
Main Authors: Yu-wen Wang, 王裕文
Other Authors: Wen-ping Yang
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/75964152649694224797