Application of FEM simulation and abductive network during nanoindentation process for bulk and film metals

碩士 === 國立虎尾科技大學 === 機械與機電工程研究所 === 96 === Nanoindentation test analysis is primary to apply in the high-tech and precise industry, because of indentation size is too small not easily by the data that direct measurement want when acquiring of the instrument result, therefore is the indentation indent...

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Bibliographic Details
Main Authors: Sheng-Yi Chang, 張聖藝
Other Authors: Tung-Sheng Yang
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/f9z979