Applying Image Alignment Technology to Automated Visual Inspection of TFT-LCD COF

碩士 === 國立臺北科技大學 === 工業工程與管理研究所 === 96 === Due to the COF printed circuit is accurate and small, our eyes are not easy to find the defect. The laborer find the defect of COF by their eyes in the factory at present. Although this method can reduce defects of product but it is very expensive and easy...

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Bibliographic Details
Main Authors: Po-Shen Yu, 游博慎
Other Authors: 田方治
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/6qjmpz