An Efficient Design of Deterministic Test Pattern Generator

碩士 === 中原大學 === 電子工程研究所 === 97 === Build-in self-test (BIST) is very efficient for system-on-chip (SoC) testing. In BIST design, test pattern generators (TPG) are the most important architecture. Pseudo-random pattern generator, e.g. linear feedback shift register (LFSR), is a common TPG. In this th...

Full description

Bibliographic Details
Main Authors: Yan-Fei Tang, 湯燕飛
Other Authors: Hsing-Chung Liang
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/50110580488164924870