Measurement of the adhesive mass and wear in Nano-scale by using AFM

碩士 === 遠東科技大學 === 機械研究所 === 97 === In this study is the measurement of the adhesion, Micro/Nano machining and wear by using atomic force microscopy (AFM). This can record the condition of the tip motion by using the numerical modeling in cutting process. The purpose of the tip adhesive experiment is...

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Bibliographic Details
Main Authors: Chi-Wen Lee, 李綺雯
Other Authors: Yen-Liang Yeh
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/17001487971109809590