Study of Contact Reliability for Cantilever Probe Card of Wafer Testing
碩士 === 義守大學 === 電子工程學系碩士班 === 97 === Wafer probe card is most important part in the wafer test system which selects the good or bad chip of integrated circuit (IC) chips. The characteristic contact conditions and mechanisms of surface degradation in a low and stable contact are essential for product...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/54095738377344461700 |